Drift Artifacts Correction for Laboratory Cone-Beam Nanoscale X-ray Computed Tomography by Fitting the Partial Trajectory of Projection Centroid

A self-correction method for the drift artifacts of laboratory cone-beam nanoscale X-ray computed tomography (nano-CT) based on trajectory projection centroid (TPC) is proposed. This does not require additional correction phantoms, simplifying process. The whole TPC estimated by partial in optimal set. calculated measured and TPC. interval search used so that proposed can adapt to case a truncated due drift. fixed-angle scanning experiment Siemens star derivative analysis position show necessity correcting artifacts. Further, Shepp–Logan phantoms with different levels are simulated. results effectively estimate horizontal vertical drifts within range ±2 mm (27 pixels) high accuracy. Experiments were conducted tomato seed bamboo stick validate feasibility samples textures. effect reconstructed slices indicates provides performance superior reference (RSM) global fitting. In addition, requires no extra scanning, which improves acquisition efficiency, as well radiation utilization.